A Blazed-Grating Scanning Spectrometer for Ultrasoft X-Rays Suitable for Use in an Electron Microprobe

  • Conference paper
Advances in X-Ray Analysis

Abstract

The importance of operating within the blaze angle is emphasized by a series of measurements of ultrasoft X-rays obtained with a new grazing-incidence, grating spectrometer. A formula to maximize output intensity has been derived which predicts a variation of input angle with changes of wavelength. The spectrometer is designed to utilize this function. The grating spectrometer was installed into an Applied Research Laboratories Analyst’s Microprobe. Since the AMX furnishes an ultrasoft spectrometer with a fatty acid pseudocrystal as standard equipment, it is possible to compare the two systems simultaneously on the same sample at the same wavelength. The grating and crystal systems are compared for peak intensity and line-to-background ratio.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Subscribe and save

Springer+ Basic
EUR 32.99 /Month
  • Get 10 units per month
  • Download Article/Chapter or Ebook
  • 1 Unit = 1 Article or 1 Chapter
  • Cancel anytime
Subscribe now

Buy Now

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 39.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 54.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free ship** worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

Similar content being viewed by others

References

  1. J. Holliday, “Soft X-Ray Emission Spectroscopy in the 13 Å to 44 Å Region,”J. Appl. Phys. 33 (11): 3259, 1962.

    Article  CAS  Google Scholar 

  2. J. B. Nicholson and D. B. Wittry, “A Comparison of the Performance of Gratings and Crystals in the 20–115 Å Region,” in: W. M. Mueller, G. R. Mallett, and M. J. Fay (eds.),Advances in X-Ray Analysis, Vol. 7, Plenum Press, New York, 1964, pp. 497–511.

    Chapter  Google Scholar 

  3. J. B. Nicholson, C. F. Mooney, and G. L. Griffin, “The Effect of Grating Blaze Angle on the Diffraction Efficiency of Ultra-Soft X-Ray Radiation,” in: W. M. Mueller, G. R. Mallett, and M. J. Fay (eds.),Advances in X-Ray Analysis, Vol. 8, Plenum Press, New York, 1965, pp. 301–314.

    Chapter  Google Scholar 

  4. B. L. Henke and J. C. Miller, “Ultra-Soft X-Ray Interaction Coefficients,” AFOSR TN-59–895, Physics Division Air Force Office of Scientific Research, Washington, D.C., 1959.

    Google Scholar 

  5. A. P. Lukirskii, E. P. Savinov, O. A. Ershov, and U. F. Shepelev, “Reflection Coefficients of Radiation in the Wavelength Range from 23.7 A to 113 A for a Number of Elements and Substances, and The Determination of the Refractive Index and Absorption Coefficient,”Opt. Spectry. USSR(English Transi.) 16 (2): 314, 1964.

    Google Scholar 

  6. R. Wuerker, “Spectral Reflectance by Solids of CarbonK Radiation,” Ph.D. Thesis, Stanford University. Palo Alto, California, 1960.

    Google Scholar 

  7. A. H. Compton and S. Allison,X-Rays in Theory and Experiment, second edition, D. Van Nostrand, New York, 1935.

    Google Scholar 

  8. M. F. Hasler and J. B. Nicholson (to be published).

    Google Scholar 

  9. J. Holliday,Handbook of X-Rays, McGraw-Hill, New York (to be published).

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Editor information

Gavin R. Mallett Marie J. Fay William M. Mueller

Rights and permissions

Reprints and permissions

Copyright information

© 1966 Springer Science+Business Media New York

About this paper

Cite this paper

Nicholson, J.B., Hasler, M.F. (1966). A Blazed-Grating Scanning Spectrometer for Ultrasoft X-Rays Suitable for Use in an Electron Microprobe. In: Mallett, G.R., Fay, M.J., Mueller, W.M. (eds) Advances in X-Ray Analysis. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-7633-0_38

Download citation

  • DOI: https://doi.org/10.1007/978-1-4684-7633-0_38

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4684-7635-4

  • Online ISBN: 978-1-4684-7633-0

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics

Navigation