Critical Field Measurements on Very thin Films of V-Ga Superconductors

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Advances in Cryogenic Engineering Materials

Part of the book series: Advances in Cryogenic Engineering ((ACRE,volume 32))

Abstract

V3Ga thin films, 500, 20, 10 and 8 nm thick have been made for the purpose of studying the role of spin-orbit scattering in the theory of high field superconductivity. Either 1 percent do**s or thin layers of high-atomic-number elements have been added to these samples in an attempt to increase the spin-orbit scattering rate in this paramagnetically limited material. Critical fields are presented and material parameters are obtained by fitting to a modified Werthamer-Helfand-Hohenberg (WHH) theory. The uniqueness of the parameters obtained in this manner is discussed in light of Fermi-liquid effects. Comparisons are drawn with bulk V3Ga.

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© 1986 Plenum Press, New York

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Tkaczyk, J.E., Tedrow, P.M. (1986). Critical Field Measurements on Very thin Films of V-Ga Superconductors. In: Reed, R.P., Clark, A.F. (eds) Advances in Cryogenic Engineering Materials . Advances in Cryogenic Engineering Materials , vol 32. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-9871-4_130

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  • DOI: https://doi.org/10.1007/978-1-4613-9871-4_130

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4613-9873-8

  • Online ISBN: 978-1-4613-9871-4

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