Abstract
Near-field optical microscopy provides clue advantages for the future nanoscale inspection of organic and inorganic materials providing ultra-short time resolution and improved spatial confinement. Starting from basic properties of optical waves, this contribution summarises what chemical and physical information may be collected when performing such (near-field) optical experiments resulting in specific and functional properties of the material under consideration. Also near-field optical microscopy (SNOM) is discussed both from is theoretical and experimental point of view, directly leading to the modern type of scattering near-field optical microscopy (s-SNOM). That type of near-field method will definitely lead to the expected realm and revival for local optical detection and tracking of functional systems on the 10 nm scale.
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Eng, L. (2005). Nanoscale Probing of Physical and Chemical Functionality with Near-Field Optical Microscopy. In: Vilarinho, P.M., Rosenwaks, Y., Kingon, A. (eds) Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials. NATO Science Series II: Mathematics, Physics and Chemistry, vol 186. Springer, Dordrecht. https://doi.org/10.1007/1-4020-3019-3_5
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DOI: https://doi.org/10.1007/1-4020-3019-3_5
Publisher Name: Springer, Dordrecht
Print ISBN: 978-1-4020-3017-8
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