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Heat transfer between a hot AFM tip and a cold sample: impact of the air pressure

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Abstract

We observe the heat flux exchanged by the hot tip of a scanning thermal microscope, which is an instrument based on the atomic force microscope. We first vary the pressure in order to analyze the impact on the hot tip temperature. Then the distance between the tip and a cold sample is varied down to few nanometers, in order to reach the ballistic regime. We observe the cooling of the tip due to the tip-sample heat flux and compare it to the current models in the literature.

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Authors and Affiliations

  1. Laboratoire EM2C, Ecole Centrale Paris-CNRS, Grande voie des vignes, 92295, Chatenay-Malabry, France

    Pierre-Olivier Chapuis, Emmanuel Rousseau & Sebastian Volz

  2. Centre de Thermique de Lyon (CETHIL), CNRS-INSA de Lyon-UCBL, Campus La Doua-LyonTech, 9 rue de la Physique, 69621, Villeurbanne, Lyon, France

    Pierre-Olivier Chapuis, Ali Assy, Séverine Gomès & Stéphane Lefèvre

  3. Groupe d’Etude des Semiconducteurs - CC074, Université de Montpellier II, Place Eugène Bataillon, 34095, Montpellier, France

    Emmanuel Rousseau

Authors
  1. Pierre-Olivier Chapuis
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  2. Emmanuel Rousseau
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  3. Ali Assy
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  4. Séverine Gomès
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  5. Stéphane Lefèvre
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  6. Sebastian Volz
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Chapuis, PO., Rousseau, E., Assy, A. et al. Heat transfer between a hot AFM tip and a cold sample: impact of the air pressure. MRS Online Proceedings Library 1543, 159–164 (2013). https://doi.org/10.1557/opl.2013.674

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  • DOI: https://doi.org/10.1557/opl.2013.674

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