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Terahertz Emission from Silicon Carbide Nanostructures

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Abstract

For the first time, electroluminescence detected in the middle and far infrared ranges from silicon carbide nanostructures on silicon, obtained in the framework of the Hall geometry. Silicon carbide on silicon was grown by the method of substitution of atoms on silicon. The electroluminescence from the edge channels of nanostructures is induced due to the longitudinal drain-source current. The electroluminescence spectra obtained in the terahertz frequency range, 3.4, 0.12 THz, arise due to the quantum Faraday effect. Within the framework of the proposed model, the longitudinal current induces a change in the number of magnetic flux quanta in the edge channels, which leads to the appearance of a generation current in the edge channel and, accordingly, to terahertz radiation.

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ACKNOWLEDGMENTS

The synthesis of a SiC layer on Si was performed using the equipment of the “Physics, Chemistry, and Mechanics of Chips and Thin Films” unique scientific unit at the Institute of Problems of Mechanical Engineering, Russian Academy of Sciences (St. Petersburg).

Funding

This study was carried out under financial support of the RSF grant (grant no. 20-12-00193).

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Correspondence to N. T. Bagraev.

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Bagraev, N.T., Kukushkin, S.A., Osipov, A.V. et al. Terahertz Emission from Silicon Carbide Nanostructures. Semiconductors 57, 347–353 (2023). https://doi.org/10.1134/S106378262309004X

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  • DOI: https://doi.org/10.1134/S106378262309004X

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