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Post-Processing of Random Number Generator in InGaAs Contact Photodiode Homodyne Circuit Based on Continuous Wavelet Transform to Improve NIST Longest Run Test Pass Rate

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Abstract

Using a continuous wavelet transform, the parameters of the noise generated in a balanced laser radiation detector at the output of an optical power divider were studied. A procedure for mathematical signal processing based on the optimization of the parameters of the wavelet transform is proposed, which made it possible to significantly increase the degree of randomness of the generated noise. The increase in the degree of randomness was demonstrated using the Longest Run test of the NIST package.

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Funding

The research was financially supported by the Ministry of Education and Science of the Russian Federation no. 121020400113-1.

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Correspondence to D. A. Mavkov or M. E. Sibgatullin.

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Mavkov, D.A., Sibgatullin, M.E., Gilyazov, L.R. et al. Post-Processing of Random Number Generator in InGaAs Contact Photodiode Homodyne Circuit Based on Continuous Wavelet Transform to Improve NIST Longest Run Test Pass Rate. Russ Microelectron 52 (Suppl 1), S332–S336 (2023). https://doi.org/10.1134/S106373972360070X

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