Abstract
EPR studies of transition-element ions in SiC and GaN and of erbium in 6H-SiC are reported. Data are presented on Sc2+ ions and scandium acceptors, and chromium and molybdenum ions in various charge states in SiC. A study was made of nickel and manganese in nominally pure GaN grown by the sandwich sublimation method. The first EPR investigation of Er in 6H-SiC is reported. Erbium was identified from the hfs of the EPR spectra. Various possible models of erbium centers in silicon carbides are discussed. Strong room-temperature erbium-ion luminescence was observed.
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Fiz. Tverd. Tela (St. Petersburg) 41, 865–867 (May 1999)
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Baranov, P.G., Il’in, I.V., Mokhov, E.N. et al. Transition and rare-earth elements in the SiC and GaN wide-gap semiconductors: Recent EPR studies. Phys. Solid State 41, 783–785 (1999). https://doi.org/10.1134/1.1130872
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DOI: https://doi.org/10.1134/1.1130872