Introduction

Polymer semiconductors (PSCs) have been developed for use in next-generation soft electronics (e.g., flexible, bendable, or stretchable devices)1,60 and a sin(omega) correction was applied for the data analyses. Agilent Cary 6000i UV/Vis/NIR spectroscopy was used to measure the UV-vis absorption spectra. A polarizer crystal was equipped to measure the absorption intensity with the polarization parallel (A//) and perpendicular (A) to the stretching directions. The dichroic ratio (DR) was determined by A///A for analyzing polymer chain alignment under strain. The rS value is defined as the ratio of DR/rDoC at various strains, the DR values were averaged from at least 3 samples from 3 different batches and the rDoC values were averaged from at least 3 samples from 3 different batches for each polymer under a specific strain condition (i.e., 0, 50, or 100% strain). All the FET devices were probed using a Keithley 4200 semiconductor parameter analyzer (Keithley Instruments Inc.) in ambient at room temperature