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Effect of Pr3+ Do** on the OH Content of Silica Xerogels

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Abstract

Pr2O3-SiO2 xerogels doped with different Pr/Si concentrations were annealed at 900°C for 120 h and then investigated by FTIR, NIR absorption, Raman and luminescence spectroscopies. It is observed that the content of surface silanol groups is lower for higher Pr3+ concentrations. Luminescence measurements indicate that the amount of the residual OH plays an important role in the spectroscopic properties of the Pr3+ ion and in particular the quantum yield of the emission from the 3P0,1 and 1D2 states.

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Authors and Affiliations

  1. C.N.R.-CeFSA, via Sommarive 14, 38050, Povo-Trento, Italy

    C. Armellini, L. Del Longo & M. Ferrari

  2. INFM, Dip. Fisica, Univ. Trento, via Sommarive 14, 38050, Povo-Trento, Italy

    M. Montagna, G. Pucker & P. Sagoo

Authors
  1. C. Armellini
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  2. L. Del Longo
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  3. M. Ferrari
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  4. M. Montagna
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  5. G. Pucker
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  6. P. Sagoo
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Armellini, C., Del Longo, L., Ferrari, M. et al. Effect of Pr3+ Do** on the OH Content of Silica Xerogels. Journal of Sol-Gel Science and Technology 13, 599–603 (1998). https://doi.org/10.1023/A:1008699412259

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  • DOI: https://doi.org/10.1023/A:1008699412259

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