Abstract
The effect of current density and Sn methane sulfonate concentration on hillock density, columnar grain size, crystallographic texture, and residual stress of bright Sn electrodeposits is measured. Correlation was found between hillock density and the ratio of the applied current density to the transport limited current density. When the ratio exceeds unity no hillocks are observed. As the transport limited current is approached and exceeded, the columnar grain size decreases from 1.4 to 0.7 μm and the preferred orientation (fiber texture) rotates toward the [001] direction. Possible explanations are presented for how these factors reduce hillock growth. Because hillock and whisker growth are related phenomena, electrodeposition beyond the limiting current may be a possible whisker mitigation strategy.
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs10800-010-0163-1/MediaObjects/10800_2010_163_Fig1_HTML.gif)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs10800-010-0163-1/MediaObjects/10800_2010_163_Fig2_HTML.gif)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs10800-010-0163-1/MediaObjects/10800_2010_163_Fig3_HTML.gif)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs10800-010-0163-1/MediaObjects/10800_2010_163_Fig4_HTML.jpg)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs10800-010-0163-1/MediaObjects/10800_2010_163_Fig5_HTML.jpg)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs10800-010-0163-1/MediaObjects/10800_2010_163_Fig6_HTML.jpg)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs10800-010-0163-1/MediaObjects/10800_2010_163_Fig7_HTML.jpg)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs10800-010-0163-1/MediaObjects/10800_2010_163_Fig8_HTML.gif)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs10800-010-0163-1/MediaObjects/10800_2010_163_Fig9_HTML.gif)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs10800-010-0163-1/MediaObjects/10800_2010_163_Fig10_HTML.gif)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs10800-010-0163-1/MediaObjects/10800_2010_163_Fig11_HTML.gif)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs10800-010-0163-1/MediaObjects/10800_2010_163_Fig12_HTML.gif)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs10800-010-0163-1/MediaObjects/10800_2010_163_Fig13_HTML.gif)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs10800-010-0163-1/MediaObjects/10800_2010_163_Fig14_HTML.gif)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs10800-010-0163-1/MediaObjects/10800_2010_163_Fig15_HTML.jpg)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs10800-010-0163-1/MediaObjects/10800_2010_163_Fig16_HTML.gif)
We’re sorry, something doesn't seem to be working properly.
Please try refreshing the page. If that doesn't work, please contact support so we can address the problem.
References
Furuta N, Hamamura K (1969) Jpn J Appl Phys 8:1404
http://nepp.nasa.gov/WHISKER/index.html. Accessed 23 June 2008
Arnold SM (1966) Plating 53:96
Lee BZ, Lee DN (1998) Acta Mater 46:3701
Tu KN (1973) Acta Metall 21:347
Tu KN (1994) Phys Rev B-Condens Matter 49:2030
Chason E, Jadhav N, Chan WL, Reinbold L, Kumar KS (2008) Appl Phys Lett 92:171901
Kumar KS, Reinbold L, Bower AF, Chason E (2008) J Mater Res 23:2916–2934
Boettinger WJ, Johnson CE, Bendersky LA, Moon K-W, Williams ME, Stafford GR (2005) Acta Mater 53:5033–5050
Barsoum MW, Hoffman EN, Doherty RD, Gupta S, Zavaliangos A (2004) Phys Rev Lett 93:206104
Chadhari PJ (1974) Appl Phys 45:4339
Jackson MS, Li C-Y (1982) Acta Metall 30:1993
Doerner MF, Nix WD (1988) CRC Crit Rev Solid State Mater Sci 14:225
Bard AJ, Faulkner LR (2001) Electrochemical methods: fundamentals and applications, 2nd edn. Wiley, NJ
Barrett CS, Massalski TB (1980) Structure of metals crystallographic methods, principles, and data, 3rd edn. Pergamon, New York, pp 204–205
Chen CS, Wan CC, Wang YY (1998) Trans Inst Met Finish 76:54–58
Paunovic Milan, Schlesinger Mordechay (1998) Fundamentals of electrochemical deposition. Wiley, New York
Fleischmann M, Thirsk HR (1963) In: Delahay P, Tobias CW (eds) Advances in electrochemistry and electrochemical engineering, vol 3. Interscience, New York
Budevski E, Bostanov V, Staikov G (1980) Ann Rev Mater Sci 10:85–112
Milchev A (2002) Electrocrystallization, fundamentals of nucleation and growth. Springer, New York
Rashidi AM, Amadeh A (2008) Surf Coat Technol 202:3772
Pinsky DA (2008) Microelectron Reliab 48:105–110
Lal S, Moyer TD (2005) IEEE Trans Electron Packag Manuf 28:63–74
Jiang B, **an A (2008) Microelectron Reliab 48:675–681
Saito M, Sasaki H, Katou K, Toba T, Homma T (2009) J Electrochem Soc 156:E86–E90
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Moon, KW., Kim, SK., Williams, M.E. et al. Effect of current density and electrolyte concentration on hillock growth from pure bright Sn electrodeposits. J Appl Electrochem 40, 1671–1681 (2010). https://doi.org/10.1007/s10800-010-0163-1
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s10800-010-0163-1