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New scattering formula for the analysis of X-ray line broadening by composition profiles

  • Solids and Materials
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Abstract

The variation of the lattice constantsa i (i=1,2,3) with the depthR in a crystalline solid leads to broadening of the x-ray reflections. The broadening is calculated for polycrystalline samples, where the lattice constant profilea i (R) extends over several grain diameters. The calculation is performed by superimposing, in kinematical theory, the waves scattered from the lattice planes with varying distances and taking into account the absorption of the x-rays in the material.

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Wieder, T., Thoma, K. & Gärtner, H. New scattering formula for the analysis of X-ray line broadening by composition profiles. Appl. Phys. A 46, 165–167 (1988). https://doi.org/10.1007/BF00939259

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  • DOI: https://doi.org/10.1007/BF00939259

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